9031.41.00.20
For inspecting photomasks or reticles used in manufacturing semiconductor devices
Classification path
- Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof
- Other optical instruments and appliances
- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
- For inspecting photomasks or reticles used in manufacturing semiconductor devices
Rates of duty
- General (MFN)
- Free
- Column 2Cuba, North Korea, Russia, Belarus
- 50%
- Unit of quantity
- No.
Related lines in heading 9031
- 9031.10.00.00Machines for balancing mechanical partsFree
- 9031.20.00.00Test benches1.7%
- 9031.41.00.40For inspecting semiconductor wafers or devices / For wafersFree
- 9031.41.00.60For inspecting semiconductor wafers or devices / OtherFree
- 9031.49.10.00Profile projectorsFree
- 9031.49.40.00Coordinate-measuring machinesFree
- 9031.49.70.00For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesFree
- 9031.49.90.00OtherFree
- 9031.80.40.00Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesFree
- 9031.80.80.60For testing electrical characteristicsFree
- 9031.80.80.70Equipment for testing the characteristics of internal combustion engines / OtherFree
- 9031.80.80.85OtherFree
About heading 9031
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof
Heading 9031 covers measuring or checking instruments, appliances and machines that are not named in another heading of chapter 90, plus profile projectors and their parts. It splits into balancing machines (9031.10), test benches (9031.20), optical instruments such as semiconductor inspection equipment, profile projectors and coordinate-measuring machines (9031.41 and 9031.49), other instruments (9031.80), and parts and accessories (9031.90). Most lines carry a general (MFN) rate of Free, with test benches at 1.7%.
Full guide to heading 9031Products in this heading
- Machines for balancing mechanical parts such as crankshafts or rotors
- Test benches for engines or mechanical assemblies
- Optical inspection equipment for semiconductor wafers, integrated circuits, photomasks and reticles
- Profile projectors used for optical comparison measurement
- Coordinate-measuring machines
- Electron beam microscopes fitted for handling and transport of semiconductor wafers or reticles
- Bases and frames for coordinate-measuring machines
- Equipment for testing the characteristics of internal combustion engines
Frequently asked questions
What is the HTS code for coordinate-measuring machines?
Coordinate-measuring machines are classified under 9031.49.40.00, which carries a general (MFN) rate of Free.
What is the duty on test benches?
Test benches are classified under 9031.20.00.00 and carry a general (MFN) rate of 1.7%.
How do I classify parts of profile projectors?
Parts and accessories of profile projectors go under 9031.90.21.00, which has a general (MFN) rate of Free.
Source: USITC Harmonized Tariff Schedule, retrieved October 22, 2026.